Digital Resistance Capacitance ESR Meter Tester 0.001 to 120 Ohm DC Resistance Meter Capacitor ESR Meter

DC Resistance Meter Capacitor ESR Meter
$45.48
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Description
Digital Resistance Capacitance ESR Meter Tester 0.001 to 120 Ohm DC Resistance Meter Capacitor ESR Meter
Product Description
HR200 is a small ESR milliohm meter, which can measure the ESR value of electrolytic capacitors and resistance milliohm meters. It is easy to use.

Applications

Measure the ESR value of electrolytic capacitor; measure the resistance value;
Specification
item
value
Measuring resistance range
0.001 ~ 120 Ω
Measuring frequency
100K Hz
Frequency measurement resolution
1mΩ
Working voltage
7 ~ 12 VDC
Operating current
<50 mA
Working temperature
-40 ℃ ~ 65 ℃ degrees Celsius
Storage temperature
-40 ℃ ~ 65 ℃ degrees Celsius
size
57 * 45 * 20 mm long X wide x high
Note
The display is backlit, standard LCD1602 interface.
Installation Instructions

Interface description and related operations

P1 interface (power supply) VDD: Positive power supply (7~12V) GND: negative power supply P2 interface (measurement) TA: Connect the measuring element. TB: Connect to measuring element.

The button description

Mes/Cal: Calibration (short-circuit measurement line calibration) FUN: not used;

ESR meter is a useful maintenance tool

1. Identify the quality of electrolytic capacitors, and the judgment accuracy is high ESR is a parameter that directly refers to the performance defect of the capacitor. Whether it is a common problem such as electrolytic capacitor leakage, drying up, or a hidden problem such as the loss of activity of the electrolyte, it can be detected by the capacitor ESR meter. To use the words of a foreign manufacturer: more than 95% of the electrolytic capacitors with problems can be found. He did not say 100% of the reason is that the capacitor ESR meter (not specially designed) cannot detect the short-circuit fault between the two contacts of the capacitor. Fortunately, the probability of such a short-circuit failure of a capacitor is much lower than the probability of failure of the capacitor itself. Even if the capacitor has a short-circuit fault or the device connected in parallel with it has a short-circuit fault, the external performance of the circuit will be very obvious and easy to be checked by an ordinary multimeter. For example, the voltage and DC resistance across the capacitor are much lower than normal values. 2. It can be measured online without removing the components, which greatly improves the detection efficiency "On-line measurement" refers to the inspection of a component without removing it from the circuit board when it is not energized. Many people know that common discrete components such as diodes, transistors, and resistors can be detected online with a multimeter, and the success rate of finding faulty components is quite high. Capacitors do not work because they need to be driven by an AC signal, and the multimeter can't do anything about it. Since electronic devices generally use electrolytic capacitors, some devices even use more than one hundred. The convenience brought by the on-line measurement enables the maintenance personnel to deal with it calmly and greatly reduces the workload, which is of great significance. 3. Small size, light weight, low power consumption, easy to carry, simple and flexible to use Capacitance ESR meters can be made portable with battery power supply, and can be used by turning on the power switch without complicated settings. Although the LCR bridge already has the function of a capacitor ESR meter, the low-end domestic LCR bridge with a high test frequency of only 1kHz costs more than 1,000 yuan, making it prohibitive for enthusiasts with limited pockets. Most of the LCR bridges are desktop instruments, which are bulky and heavy, and require an external mains power supply to work. It is inconvenient to drag a tail when using them. The test level of the hand-held LCR bridge is generally fixed and the typical value is 0.3Vrms (ie 848mVpp). Such levels have reached the turn-on value of many semiconductor devices, causing some results from in-line measurements to become unreliable.
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